| Title | Hidden Markov Models to Identify Pilots Instrument Scanning and Attention Patterns |
| Publication Type | Conference Paper |
| Year of Publication | 2003 |
| Authors | Hayashi, M. |
| Conference Name | IEEE International Conference on Systems, Man & Cybernetics, 2889-2896 |
| Date Published | October 5-8 |
| Conference Location | Washington, DC |
| MVL Report Number | 03.29 |